Herein voltage and frequency controlled thin film transistors fabricated by depositing SeO 2 onto germanium thin crystals are reported. For these devices measurements of the current-voltage characteristics revealed a biasing dependent rectification ratios. The devices showed metal-oxide-semiconductor character under reverse biasing conditions. In addition, the biasing dependent capacitance and conductance spectral studies in the frequency domain of 20M-1000MHz has shown the possibility of switching the capacitance and negative conductance from negative mode to positive mode. The features
of the Ge/SeO 2 devices make them attractive for use in electronic circuits as parasitic capacitive circuit elements, noise reducers, signal amplifiers and microwave oscillator.
Authors
A. F. Qasrawi
H. K. Khanfar
Pages From
177
Pages To
186
ISSN
1584-8663
Journal Name
Chalcogenide Letters
Volume
20
Issue
3
Abstract